ProiectusCPatens
Nomen | Gradus | ProiectusCPatens,% | vexillum | |||||||||||
Si | Mn | Ni | Sn | Fe | Pb | Zn | Mg | C | S | P | Cu | |||
Silicon Silicon | TQsi1.5-0.5 | 1.35 ~ 1.85 | 0,1 0,6 | ≤0.2 | - | ≤0.3 | ≤0.03 | ≤0.5 | - | - | - | - | Bal. | Q / szd01-2012 |
et dimensionem tolerantia
Dia./ mm | 0,03 ~ 0.10 | >0,1 ~ 0.030 | >0.30 ~ 0.60 | >0.60 ~ 1.00 | >1.00 ~ 3,00 | >3,00 ~ 6.00 | |
Tolerance(±)) | Ⅰ | 0.003 | 0.004 | 0.007 | 0.010 | 0.015 | 0.020 |
Ⅱ | 0.004 | 0.005 | 0.009 | 0.015 | 0.020 | 0.030 | |
Ⅲ | 0.005 | 0.006 | 0.010 | 0.020 | 0.030 | 0.040 |
Productum perficientur
Gradus | Res | Dia. mm |
N / mm2(≥) | Elongatio %(≥) | ResistentiaΜω·m | STandard |
TQsi1.5-0.5 | M | 0,03 ~ 0.10 | CCC | 15 | 0.167± 0.03 | Q / szd01-2012 |
>0,10 ~ 0.60 | CCLXXX | 20 | ||||
>0.60 ~ 1.00 | CCLX | 25 | ||||
>1.00 ~ 3,00 | CCL | 30 | ||||
>3,00 ~ 6.00 | CCXL | 30 |